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<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.2 20190208//EN" "http://jats.nlm.nih.gov/publishing/1.2/JATS-journalpublishing1.dtd">
<article article-type="research-article" dtd-version="1.2" xml:lang="ru" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><front><journal-meta><journal-id journal-id-type="issn">2518-1092</journal-id><journal-title-group><journal-title>Research result. Information technologies</journal-title></journal-title-group><issn pub-type="epub">2518-1092</issn></journal-meta><article-meta><article-id pub-id-type="doi">10.18413/2518-1092-2018-3-4-0-6</article-id><article-id pub-id-type="publisher-id">1566</article-id><article-categories><subj-group subj-group-type="heading"><subject>SYSTEM ANALYSIS AND PROCESSING OF KNOWLEDGE</subject></subj-group></article-categories><title-group><article-title>TECHNIQUE SELECTION TECHNIQUE FOR IMPLEMENTING THE DEVICE INTENDED FOR CAUSING FAULT IN THE ELECTRICAL COMMUNICATION CABLE</article-title><trans-title-group xml:lang="en"><trans-title>TECHNIQUE SELECTION TECHNIQUE FOR IMPLEMENTING THE DEVICE INTENDED FOR CAUSING FAULT IN THE ELECTRICAL COMMUNICATION CABLE</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="ru"><surname>Smirnov</surname><given-names>Andrey Vyacheslavovich</given-names></name><name xml:lang="en"><surname>Smirnov</surname><given-names>Andrey Vyacheslavovich</given-names></name></name-alternatives><email>sav_smirnof@mail.ru</email></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="ru"><surname>Basov</surname><given-names>Oleg Olegovich</given-names></name><name xml:lang="en"><surname>Basov</surname><given-names>Oleg Olegovich</given-names></name></name-alternatives><email>oobasov@mail.ru</email></contrib></contrib-group><pub-date pub-type="epub"><year>2018</year></pub-date><volume>3</volume><issue>4</issue><fpage>0</fpage><lpage>0</lpage><self-uri content-type="pdf" xlink:href="/media/information/2018/4/it_6.pdf" /><abstract xml:lang="ru"><p>The paper discusses the options for building a device for making failures in the electrical&amp;nbsp;communication cable. Using the analytical hierarchy method, it is reasonable to use for its&amp;nbsp;implementation: contact relays - to simulate a break, variable resistors with servo drives - to&amp;nbsp;simulate the asymmetry of the wires, multi-position switches with stepper motors - to introduce&amp;nbsp;faults &amp;ldquo;insulation failure between two wires of different pairs&amp;rdquo; and &amp;ldquo;violation insulation to earth&amp;nbsp;ground&amp;rdquo;. The optimal choice was made according to the five most frequently used criteria: cost,&amp;nbsp;weight and dimensions, efficiency (speed of fault simulation), power consumption in case of&amp;nbsp;faults and versatility of use.</p></abstract><trans-abstract xml:lang="en"><p>The paper discusses the options for building a device for making failures in the electrical&amp;nbsp;communication cable. Using the analytical hierarchy method, it is reasonable to use for its&amp;nbsp;implementation: contact relays - to simulate a break, variable resistors with servo drives - to&amp;nbsp;simulate the asymmetry of the wires, multi-position switches with stepper motors - to introduce&amp;nbsp;faults &amp;ldquo;insulation failure between two wires of different pairs&amp;rdquo; and &amp;ldquo;violation insulation to earth&amp;nbsp;ground&amp;rdquo;. The optimal choice was made according to the five most frequently used criteria: cost,&amp;nbsp;weight and dimensions, efficiency (speed of fault simulation), power consumption in case of&amp;nbsp;faults and versatility of use.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>analytical hierarchy method</kwd><kwd>manual switching</kwd><kwd>automatic switching</kwd><kwd>insulation damage</kwd><kwd>short circuit</kwd><kwd>resistance asymmetry</kwd></kwd-group><kwd-group xml:lang="en"><kwd>analytical hierarchy method</kwd><kwd>manual switching</kwd><kwd>automatic switching</kwd><kwd>insulation damage</kwd><kwd>short circuit</kwd><kwd>resistance asymmetry</kwd></kwd-group></article-meta></front><back /></article>