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<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.2 20190208//EN" "http://jats.nlm.nih.gov/publishing/1.2/JATS-journalpublishing1.dtd">
<article article-type="research-article" dtd-version="1.2" xml:lang="ru" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><front><journal-meta><journal-id journal-id-type="issn">2518-1092</journal-id><journal-title-group><journal-title>Research result. Information technologies</journal-title></journal-title-group><issn pub-type="epub">2518-1092</issn></journal-meta><article-meta><article-id pub-id-type="doi">10.18413/2518-1092-2017-2-2-3-8</article-id><article-id pub-id-type="publisher-id">1126</article-id><article-categories><subj-group subj-group-type="heading"><subject>SYSTEM ANALYSIS AND PROCESSING OF KNOWLEDGE</subject></subj-group></article-categories><title-group><article-title>JUSTIFICATION FOR NEED OF COMBINED USE OF AUTOMATIC OPTICAL INSPECTION AND NON-DESTRUCTIVE X-RAY CONTROL OF ELECTRONIC MODULES</article-title><trans-title-group xml:lang="en"><trans-title>JUSTIFICATION FOR NEED OF COMBINED USE OF AUTOMATIC OPTICAL INSPECTION AND NON-DESTRUCTIVE X-RAY CONTROL OF ELECTRONIC MODULES</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="ru"><surname>Osipenko</surname><given-names>Anna Alexandrovna</given-names></name><name xml:lang="en"><surname>Osipenko</surname><given-names>Anna Alexandrovna</given-names></name></name-alternatives><email>rijaya_oska@rambler.ru</email></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="ru"><surname>Ignatenkova</surname><given-names>Olesya Aleksandrovna</given-names></name><name xml:lang="en"><surname>Ignatenkova</surname><given-names>Olesya Aleksandrovna</given-names></name></name-alternatives><email>olesya_ignatenko@mail.ru</email></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="ru"><surname>Grigorov</surname><given-names>Mikhail Sergeevich</given-names></name><name xml:lang="en"><surname>Grigorov</surname><given-names>Mikhail Sergeevich</given-names></name></name-alternatives><email>gms.orel@mail.ru</email></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="ru"><surname>Basov</surname><given-names>Oleg Olegovich</given-names></name><name xml:lang="en"><surname>Basov</surname><given-names>Oleg Olegovich</given-names></name></name-alternatives><email>oobasov@mail.ru</email></contrib></contrib-group><pub-date pub-type="epub"><year>2017</year></pub-date><volume>2</volume><issue>2</issue><fpage>0</fpage><lpage>0</lpage><self-uri content-type="pdf" xlink:href="/media/information/2017/2/IT_1.pdf" /><abstract xml:lang="ru"><p>The result of analysis of the principles and methods in part of quality control of electronic modules and their functional elements at different stages of their production and operation is provided in this paper. The defect types revealed by means of automatic optical inspection and non-destructive X-ray control are systematized. The result of analysis of the existing technique level in the field of automatic optical inspection and non-destructive X-ray control of defects of electronic modules are given. The possibilities of the systems combining these methods, and, in particular, software subsystems, and also the direction of enhancement of knoware and the software of these systems in the conditions of increase of complexity and non-uniformity of controlled products are defined.</p></abstract><trans-abstract xml:lang="en"><p>The result of analysis of the principles and methods in part of quality control of electronic modules and their functional elements at different stages of their production and operation is provided in this paper. The defect types revealed by means of automatic optical inspection and non-destructive X-ray control are systematized. The result of analysis of the existing technique level in the field of automatic optical inspection and non-destructive X-ray control of defects of electronic modules are given. The possibilities of the systems combining these methods, and, in particular, software subsystems, and also the direction of enhancement of knoware and the software of these systems in the conditions of increase of complexity and non-uniformity of controlled products are defined.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>electronic module</kwd><kwd>optical inspection</kwd><kwd>non-destructive X-ray control</kwd><kwd>knoware and software</kwd></kwd-group><kwd-group xml:lang="en"><kwd>electronic module</kwd><kwd>optical inspection</kwd><kwd>non-destructive X-ray control</kwd><kwd>knoware and software</kwd></kwd-group></article-meta></front><back /></article>